Optimal thickness of TiO2 layer on resonance waveguide grating for maximum of electric field by simulation method in comparison with experiment
Crossref DOI link: https://doi.org/10.1007/s11082-025-08139-7
Published Online: 2025-03-19
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nguyen, Van Nghia
Text and Data Mining valid from 2025-03-19
Version of Record valid from 2025-03-19
Article History
Received: 2 October 2024
Accepted: 28 February 2025
First Online: 19 March 2025
Declarations
:
: The authors declare no conflict of interest.