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Investigation of nanoscale surface roughness, fractal growth, optical constant and dispersion parameters of rf-sputtered CdS thin films for high-performance metal–semiconductor photodetector

Crossref DOI link: https://doi.org/10.1007/s11082-025-08244-7

Published Online: 2025-05-18

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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