Comprehensive DFT analysis of structural, optoelectronic, and thermoelectric properties of ZnGa2X4 (X = S, Se, and Te) defect chalcopyrites for energy applications
Crossref DOI link: https://doi.org/10.1007/s11082-025-08252-7
Published Online: 2025-05-17
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Benaadad, Merieme
Labrag, Abdelaziz
Bghour, Mustapha
El-Ouaddi, Hassan
Text and Data Mining valid from 2025-05-17
Version of Record valid from 2025-05-17
Article History
Received: 24 November 2024
Accepted: 1 May 2025
First Online: 17 May 2025
Declarations
:
: The authors declare no competing interests.
: Not applicable.