An XPS Study with Depth Profiling for the Surface Oxide Layer Formed on Aluminides Produced on Superalloy 690 Substrates
Crossref DOI link: https://doi.org/10.1007/s11085-017-9813-6
Published Online: 2017-10-28
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dutta, R. S.
Banerjee, Rumu H.
Dey, G. K.
Funding for this research was provided by:
Department of Atomic Energy, Government of India (IN)
License valid from 2017-10-28