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Electrical and Optical Studies of Defect Structure of HgCdTe Films Grown by Molecular Beam Epitaxy

Crossref DOI link: https://doi.org/10.1007/s11182-016-0792-x

Published Online: 2016-07-11

Published Print: 2016-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Świątek, Z.

Ozga, P.

Izhnin, I. I.

Fitsych, E. I.

Voitsekhovskii, A. V.

Korotaev, A. G.

Mynbaev, K. D.

Varavin, V. S.

Dvoretsky, S. A.

Mikhailov, N. N.

Yakushev, M. V.

Bonchyk, A. Yu.

Savytsky, H. V.
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