Investigation of Correlation of Test Sequences for Reliability Testing of Digital Physical System Components
Crossref DOI link: https://doi.org/10.1007/s11182-016-0902-9
Published Online: 2016-12-06
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kushik, N. G.
López, J. E.
Yevtushenko, N. V.
License valid from 2016-12-01
