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Admittance of MIS-Structures Based on HgCdTe with a Double-Layer CdTe/Al2O3 Insulator

Crossref DOI link: https://doi.org/10.1007/s11182-018-1294-9

Published Online: 2018-03-13

Published Print: 2018-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Dzyadukh, S. M.

Voitsekhovskii, A. V.

Nesmelov, S. N.

Sidorov, G. Yu.

Varavin, V. S.

Vasil’ev, V. V.

Dvoretsky, S. A.

Mikhailov, N. N.

Yakushev, M. V.
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Article History

Received: 25 September 2017

First Online: 13 March 2018