Peculiarities of Modeling the Frequency Dependences of Admittance of MIS Structure Based on Organic P3HT Film with an Insulator Al2O3 Layer
Crossref DOI link: https://doi.org/10.1007/s11182-019-01646-7
Published Online: 2019-03-27
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Voitsekhovskii, A. V.
Nesmelov, S. N.
Dzyadukh, S. M.
Text and Data Mining valid from 2019-03-01
Article History
Received: 7 August 2018
First Online: 27 March 2019