A Study of Complex Defect Formation in Silicon Doped With Nickel
Crossref DOI link: https://doi.org/10.1007/s11182-023-02801-x
Published Online: 2023-02-01
Published Print: 2023-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nasriddinov, S. S.
Esbergenov, D. M.
Text and Data Mining valid from 2023-01-01
Version of Record valid from 2023-01-01
Article History
Received: 6 August 2021
Accepted: 3 March 2022
First Online: 1 February 2023