Analyzing the value of technology based on the differences of patent citations between applicants and examiners
Crossref DOI link: https://doi.org/10.1007/s11192-017-2323-0
Published Online: 2017-03-07
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Inchae
Jeong, Yujin
Yoon, Byungun
Funding for this research was provided by:
National Research Foundation of Korea (NRF-2014R1A1A2054892)
License valid from 2017-03-07