A pattern-based outlier region detection method for two-dimensional arrays
Crossref DOI link: https://doi.org/10.1007/s11227-018-2418-2
Published Online: 2018-05-24
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Ki Yong
Suh, Young-Kyoon https://orcid.org/0000-0003-3124-2566
Funding for this research was provided by:
National Research Foundation of Korea (2015R1C1A1A02037071)
Text and Data Mining valid from 2018-05-24
Article History
First Online: 24 May 2018