A study on optimization of PCB defect detection based on ACSD-YOLO
Crossref DOI link: https://doi.org/10.1007/s11227-025-07602-2
Published Online: 2025-07-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Du, Qinsheng
Shen, Chao
Zhang, Shiyan
Zhang, Ningbo
Du, Zuosheng
Guo, Xin
Zhao, Jian
Text and Data Mining valid from 2025-07-03
Version of Record valid from 2025-07-03
Article History
Accepted: 21 June 2025
First Online: 3 July 2025
Declarations
:
: The authors declare that they have no conflict of interest.