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Comparative Analysis of Open and Short Defects in Embedded SRAM Using Parasitic Extraction Method for Deep Submicron Technology

Published Online: 2023-08-28

Published Print: 2023-10

Authors

Maddela, Venkatesham

Sinha, Sanjeet Kumar https://orcid.org/0000-0002-7581-4645
Parvathi, Muddapu

Sharma, Vinay
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Text and Data Mining valid from 2023-08-28

Version of Record valid from 2023-08-28
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Article History

Accepted: 8 August 2023

First Online: 28 August 2023

Declarations

:

: No conflicts of Interest.

Document is current