Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation
Crossref DOI link: https://doi.org/10.1007/s11340-015-0083-4
Published Online: 2015-09-11
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stinville, J.C.
Echlin, M.P.
Texier, D.
Bridier, F.
Bocher, P.
Pollock, T.M.
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