An Analytical Model for Defect Depth Estimation Using Pulsed Thermography
Crossref DOI link: https://doi.org/10.1007/s11340-016-0143-4
Published Online: 2016-03-21
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Angioni, S.L.
Ciampa, F.
Pinto, F.
Scarselli, G.
Almond, D.P.
Meo, M. http://orcid.org/0000-0003-1633-8930
License valid from 2016-03-21