Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers
Crossref DOI link: https://doi.org/10.1007/s11340-016-0177-7
Published Online: 2016-05-26
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lin, T.-W.
Rowe, L. P.
Kaczkowski, A. J.
Horn, G. P.
Johnson, H. T.
Funding for this research was provided by:
National Science Foundation (CMMI-13-00466)
Text and Data Mining valid from 2016-05-26
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Article History
Received: 19 January 2016
Accepted: 19 May 2016
First Online: 26 May 2016