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Development of Solute-solvent Separation Soft Lithography Grating for Measuring High-temperature In situ Deformation Using Scanning Electron Microscope Moiré Method

Crossref DOI link: https://doi.org/10.1007/s11340-018-00436-5

Published Online: 2018-10-08

Published Print: 2019-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Fan, B. https://orcid.org/0000-0002-4194-883X
Li, J.

Xie, H.

Dai, X.
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (11672153)

National Natural Science Foundation of China (11232008)
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Article History

Received: 11 May 2018

Accepted: 21 September 2018

First Online: 8 October 2018

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