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Residual Stresses in Cu/Ni Multilayer Thin Films Measured Using the Sin2ψ Method

Crossref DOI link: https://doi.org/10.1007/s11340-018-00447-2

Published Online: 2018-11-08

Published Print: 2019-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

McDonald, I. G.

Moehlenkamp, W. M.

Arola, D.

Wang, J.
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Text and Data Mining valid from 2018-11-08
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Article History

Received: 4 June 2018

Accepted: 22 October 2018

First Online: 8 November 2018

Change Date: 28 March 2019

Change Type: Correction

Change Details: A correction has been published.