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Creep Characterization of Amorphous SiO2 in the Transmission Electron Microscope Using Digital Image Correlation and Finite Element Analysis

Published Online: 2023-02-09

Published Print: 2023-04

Authors

Zhang, Y.

Dillon, S.

Lambros, J.
Funding

Funding for this research was provided by:

National Science Foundation (18-25466)
License Information

Text and Data Mining valid from 2023-02-09

Version of Record valid from 2023-02-09
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Article History

Received: 15 July 2022

Accepted: 29 December 2022

First Online: 9 February 2023

Declarations

:

: The authors declare that they have no conflict of interest.

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