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Semi-custom methodology to fabricate transmission electron microscopy chip for in situ characterization of nanodevices and nanomaterials

Crossref DOI link: https://doi.org/10.1007/s11431-021-1980-1

Published Online: 2022-03-10

Published Print: 2022-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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