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Single event transient characterization of SiGe HBT by SPA experiment and 3-D process simulation

Published Online: 2022-04-14

Published Print: 2022-05

Authors

Pan, XiaoYu

Guo, HongXia

Feng, YaHui

Liu, YiNong

Zhang, JinXin

Li, Zhuang

Luo, YinHong

Zhang, FengQi

Wang, Tan

Zhao, Wen

Ding, LiLi

Xu, JingYan
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Text and Data Mining valid from 2022-04-14

Version of Record valid from 2022-04-14
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Article History

Received: 10 December 2021

Accepted: 15 February 2022

First Online: 14 April 2022

Document is current