Mechanical-electrical synergy damage effect on GaN HEMT under high-power microwave
Crossref DOI link: https://doi.org/10.1007/s11431-023-2407-3
Published Online: 2023-07-07
Published Print: 2023-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Lei
Chai, ChangChun
Zhao, TianLong
Li, FuXing
Qin, YingShuo
Yang, YinTang
Text and Data Mining valid from 2023-07-07
Version of Record valid from 2023-07-07
Article History
Received: 10 February 2023
Accepted: 19 April 2023
First Online: 7 July 2023