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Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology

Crossref DOI link: https://doi.org/10.1007/s11432-013-4982-7

Published Online: 2014-05-13

Published Print: 2014-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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