Terahertz detector for imaging in 180-nm standard CMOS process
Crossref DOI link: https://doi.org/10.1007/s11432-015-0976-9
Published Online: 2017-02-10
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Zhaoyang
Liu, Liyuan
Zhang, Zhao
Liu, Jian
Wu, Nanjian
License valid from 2017-02-10