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Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach

Crossref DOI link: https://doi.org/10.1007/s11432-017-9290-4

Published Online: 2018-05-24

Published Print: 2018-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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