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Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors

Crossref DOI link: https://doi.org/10.1007/s11432-018-9554-4

Published Online: 2019-01-10

Published Print: 2019-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wang, Zujun

Xue, Yuanyuan

Chen, Wei

Xu, Rui

Ning, Hao

He, Baoping

Yao, Zhibin

Liu, Minbo

Sheng, Jiangkun

Ma, Wuying

Dong, Guantao
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Text and Data Mining valid from 2019-01-10
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Article History

Received: 13 March 2018

Revised: 13 August 2018

Accepted: 23 August 2018

First Online: 10 January 2019