Physical mechanism of performance adjustment in selective buried oxide n-MOSFETs
Crossref DOI link: https://doi.org/10.1007/s11432-018-9791-2
Published Online: 2019-04-04
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huang, Qin
Liu, Renhua
Sun, Yabin
Li, Xiaojin
Shi, Yanling
Wang, Changfeng
Liao, Duanduan
Tian, Ming
Text and Data Mining valid from 2019-04-04
Article History
Received: 9 September 2018
Revised: 3 February 2019
Accepted: 22 February 2019
First Online: 4 April 2019