Low power and high uniformity of HfOx-based RRAM via tip-enhanced electric fields
Crossref DOI link: https://doi.org/10.1007/s11432-019-9910-x
Published Online: 2019-08-20
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Xiaokang
Zhang, Baotong
Wang, Bowen
Xu, Xiaoyan
Yang, Yuancheng
Sun, Shuang
Cai, Qifeng
Hu, Shijie
An, Xia
Li, Ming
Huang, Ru
Text and Data Mining valid from 2019-08-20
Version of Record valid from 2019-08-20
Article History
Received: 22 March 2019
Revised: 22 April 2019
Accepted: 31 May 2019
First Online: 20 August 2019