Contact engineering for temperature stability improvement of Bi-contacted MoS2 field effect transistors
Crossref DOI link: https://doi.org/10.1007/s11432-023-3942-2
Published Online: 2024-05-15
Published Print: 2024-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Zizheng
Zhang, Qing
Huang, Xiaohe
Liu, Chunsen
Zhou, Peng
Text and Data Mining valid from 2024-05-15
Version of Record valid from 2024-05-15
Article History
Received: 23 October 2023
Revised: 7 December 2023
Accepted: 22 January 2024
First Online: 15 May 2024