The 2-axis stress component decoupling of {100} c-Si by using oblique backscattering micro-Raman spectroscopy
Crossref DOI link: https://doi.org/10.1007/s11433-020-1537-y
Published Online: 2020-05-11
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fu, DongHui
He, XiaoYong
Ma, LuLu
Xing, HuaDan
Meng, Tian
Chang, Ying
Qiu, Wei
Text and Data Mining valid from 2020-05-11
Version of Record valid from 2020-05-11
Article History
Received: 14 January 2020
Accepted: 28 February 2020
First Online: 11 May 2020