Optical contrast determination of the thickness of SiO2 film on Si substrate partially covered by two-dimensional crystal flakes
Crossref DOI link: https://doi.org/10.1007/s11434-015-0774-3
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lu, Yan
Li, Xiao-Li
Zhang, Xin
Wu, Jiang-Bin
Tan, Ping-Heng
Text and Data Mining valid from 2015-04-01