Local electrical characterization of two-dimensional materials with functional atomic force microscopy
Crossref DOI link: https://doi.org/10.1007/s11467-018-0879-7
Published Online: 2019-01-28
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hussain, Sabir
Xu, Kunqi
Ye, Shili
Lei, Le
Liu, Xinmeng
Xu, Rui
Xie, Liming
Cheng, Zhihai
Text and Data Mining valid from 2019-01-28
Article History
Received: 7 September 2018
Accepted: 16 December 2018
First Online: 28 January 2019