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Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy

Published Online: 2020-10-08

Published Print: 2020-12

Authors

Zheng, Zhi-Yue

Pan, Yu-Hao

Pei, Teng-Fei

Xu, Rui

Xu, Kun-Qi

Lei, Le

Hussain, Sabir

Liu, Xiao-Jun

Bao, Li-Hong

Gao, Hong-Jun

Ji, Wei

Cheng, Zhi-Hai
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Text and Data Mining valid from 2020-10-08

Version of Record valid from 2020-10-08
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Article History

Received: 2 July 2020

Accepted: 23 August 2020

First Online: 8 October 2020

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