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Interfacial properties of 2D WS2 on SiO2 substrate from X-ray photoelectron spectroscopy and first-principles calculations

Crossref DOI link: https://doi.org/10.1007/s11467-022-1167-0

Published Online: 2022-06-30

Published Print: 2022-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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