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Theoretical Analysis of Multilayer Surface Plasmon Resonance Sensors Using Thin-Film Optical Admittance Formalism

Crossref DOI link: https://doi.org/10.1007/s11468-015-9945-y

Published Online: 2015-05-10

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy