Rapid and Nondestructive Determination of Graphene Thickness with an all Dielectric Metasurface
Crossref DOI link: https://doi.org/10.1007/s11468-016-0434-8
Published Online: 2016-12-08
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Shang
Song, Qinghai
Xiao, Shumin
License valid from 2016-12-08
