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YOLO-FGD: a fast lightweight PCB defect method based on FasterNet and the Gather-and-Distribute mechanism

Crossref DOI link: https://doi.org/10.1007/s11554-024-01504-x

Published Online: 2024-07-03

Published Print: 2024-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Qin, Changxin https://orcid.org/0009-0001-8465-0056
Zhou, Zhongyu
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Text and Data Mining valid from 2024-07-03

Version of Record valid from 2024-07-03
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Article History

Received: 28 April 2024

Accepted: 22 June 2024

First Online: 3 July 2024

Declarations

:

: The authors declare no competing interests.