Investigation of the frequency effect on electrical modulus and dielectric properties of Al/p-Si structure with %0.5 Bi:ZnO interfacial layer
Crossref DOI link: https://doi.org/10.1007/s11581-024-05527-z
Published Online: 2024-04-17
Published Print: 2024-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bengi, S.
Çetinkaya, H. G.
Altındal, Ş.
Durmuş, P.
Text and Data Mining valid from 2024-04-17
Version of Record valid from 2024-04-17
Article History
Received: 17 February 2024
Revised: 21 March 2024
Accepted: 10 April 2024
First Online: 17 April 2024
Declarations
:
: The authors declare no competing interests.