Carrier transport across grain boundaries in polycrystalline silicon thin film transistors
Crossref DOI link: https://doi.org/10.1007/s11595-016-1335-6
Published Online: 2016-02-03
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Yong
Zhang, Shuang
Li, Zhang
Huang, Hanhua
Wang, Wenfeng
Zhou, Chao
Cao, Wanqiang
Zhou, Yuming
Text and Data Mining valid from 2016-02-01