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Substructural Properties and Anisotropic Peak Broadening in Zn1−x Mn x Te Films Determined by a Combined Methodology Based on SEM, HRTEM, XRD, and HRXRD

Crossref DOI link: https://doi.org/10.1007/s11661-016-3762-6

Published Online: 2016-09-19

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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