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In-Situ Monitoring for Defect Identification in Nickel Alloy Complex Geometries Fabricated by L-PBF Additive Manufacturing

Published Online: 2020-10-14

Published Print: 2020-12

Authors

McNeil, J. Logan

Sisco, Kevin

Frederick, Curt

Massey, Michael

Carver, Keith

List, Fred III

Qiu, Caian

Mader, Morgan

Sundarraj, Suresh

Babu, S. S.
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Text and Data Mining valid from 2020-10-14

Version of Record valid from 2020-10-14
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Article History

Received: 17 May 2020

Accepted: 15 September 2020

First Online: 14 October 2020

Document is current