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Nanoscale Investigation of Grain Growth in RF-Sputtered Indium Tin Oxide Thin Films by Scanning Probe Microscopy

Crossref DOI link: https://doi.org/10.1007/s11664-014-3212-4

Published Online: 2014-07-18

Published Print: 2014-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Lamsal, B. S.

Dubey, M.

Swaminathan, V.

Huh, Y.

Galipeau, D.

Qiao, Q.

Fan, Q. H.
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