Surface Roughness and Critical Exponent Analyses of Boron-Doped Diamond Films Using Atomic Force Microscopy Imaging: Application of Autocorrelation and Power Spectral Density Functions
Crossref DOI link: https://doi.org/10.1007/s11664-014-3262-7
Published Online: 2014-06-21
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, S.
Vierkant, G. P.
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