Comparative Study of Shallow Acceptor Levels in Unintentionally Doped p-Type GaSe Crystals Prepared by the Bridgman and Liquid Phase Solution Growth Methods
Crossref DOI link: https://doi.org/10.1007/s11664-014-3284-1
Published Online: 2014-07-08
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nagai, Yuki
Maeda, Kensaku
Suzuki, Kohei
Oyama, Yutaka
Text and Data Mining valid from 2014-07-08