Crossmark

Studies of the Origins of Half-Loop Arrays and Interfacial Dislocations Observed in Homoepitaxial Layers of 4H-SiC

Crossref DOI link: https://doi.org/10.1007/s11664-014-3497-3

Published Online: 2014-11-08

Published Print: 2015-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wang, H.

Dudley, M.

Wu, F.

Yang, Y.

Raghothamachar, B.

Zhang, J.

Chung, G.

Thomas, B.

Sanchez, E.K.

Mueller, S.G.

Hansen, D.

Loboda, M.J.
License Information

Text and Data Mining valid from 2014-11-08