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Controlling the Performance of P-type Cu2O/SnO Bilayer Thin-Film Transistors by Adjusting the Thickness of the Copper Oxide Layer

Crossref DOI link: https://doi.org/10.1007/s11664-014-3504-8

Published Online: 2014-11-11

Published Print: 2015-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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