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Determining the Thermal Conductivity of Nanocrystalline Bismuth Telluride Thin Films Using the Differential 3ω Method While Accounting for Thermal Contact Resistance

Crossref DOI link: https://doi.org/10.1007/s11664-015-3646-3

Published Online: 2015-01-31

Published Print: 2015-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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