CH4/Ar/H2/SF6 Plasma Etching for Surface Oxide Removal of Indium Bumps
Crossref DOI link: https://doi.org/10.1007/s11664-015-3786-5
Published Online: 2015-04-22
Published Print: 2015-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huang, Yue
Lin, Chun
Ye, Zhen-Hua
Liao, Qing-Jun
Ding, Rui-Jun
Text and Data Mining valid from 2015-04-22