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Graphene-based Test Platform in Potential Application for FET with Guanine as Gate Dielectric

Crossref DOI link: https://doi.org/10.1007/s11664-015-3797-2

Published Online: 2015-05-19

Published Print: 2015-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Williams, Adrienne D.

Ouchen, Fahima

Kim, Steve S.

Ngo, Yen H.

Elhamri, Said

Siwecki, Arthur

Mou, Shin

Campo, Eva M.

Kozlowski, Gregory

Naik, Rajesh R.

Grote, James
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