Influence of LaNiO3 and LaNi0.5Mn0.5O3 Buffer Layers on the Structural and Electrical Properties of BiNi0.5Mn0.5O3 Thin Films
Crossref DOI link: https://doi.org/10.1007/s11664-015-3837-y
Published Online: 2015-05-22
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huang, Xian-Xiong
Tang, Xin-Gui
Lai, Ju-Lan
Jiang, Yan-Ping
Liu, Qiu-Xiang
Xiong, De-Ping
Text and Data Mining valid from 2015-05-22